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  A Test Restoration Method based on Genetic Algorithm for effective fault localization in multiple-fault programs
 
 
Title: A Test Restoration Method based on Genetic Algorithm for effective fault localization in multiple-fault programs
Author: Xiaobo, Yan
Bin, Liu
Shihai, Wang
Appeared in: Journal of systems and software
Paging: Volume 172 () nr. C pages p.
Year: 2021
Contents:
Publisher: Elsevier Inc.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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