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Journal description
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Details for article 2 of 7 found articles
| Title: |
Automated defect identification via path analysis-based features with transfer learning |
| Author: |
Zhang, Yuwei Jin, Dahai Xing, Ying Gong, Yunzhan |
| Appeared in: |
Journal of systems and software |
| Paging: | Volume 166 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
The Author(s) |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 7 found articles
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