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  Reliability over consecutive releases of a semiconductor Optical Endpoint Detection software system developed in a small company
 
 
Title: Reliability over consecutive releases of a semiconductor Optical Endpoint Detection software system developed in a small company
Author: Abuta, Eric
Tian, Jeff
Appeared in: Journal of systems and software
Paging: Volume 137 (2018) nr. C pages 355-365
Year: 2018
Contents:
Publisher: Elsevier Inc.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 40 of 49 found articles
 
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