|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 11 of 13 found articles
| Title: |
Mutation testing cost reduction by clustering overlapped mutants |
| Author: |
Ma, Yu-Seung Kim, Sang-Woon |
| Appeared in: |
Journal of systems and software |
| Paging: | Volume 115 (2016) nr. C pages 13 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Inc. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 13 found articles
| << previous | next >> |