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Details for article 1 of 15 found articles
| Title: |
An investigation of the hydrogenated Si-SiO2 interface by X-ray diffraction |
| Author: |
Rzhanov, A.E. Filippov, V.I. Chaplanov, V.A. Yakimov, S.S. |
| Appeared in: |
Materials letters |
| Paging: | Volume 6 (1988) nr. 5-6 pages 3 p. |
| Year: |
1988 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 15 found articles
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