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  Influences of vacuum annealing induced oxygen defects on the transfer characteristics of a-ITO thin-film transistors
 
 
Title: Influences of vacuum annealing induced oxygen defects on the transfer characteristics of a-ITO thin-film transistors
Author: Lu, Wenmo
Wang, Chen
Luo, Qiaomei
Song, Yong
Li, Fengnan
Ma, Fei
Appeared in: Materials letters
Paging: Volume 311 () nr. C pages p.
Year: 2022
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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