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                                       Details for article 12 of 15 found articles
 
 
  TEM analysis of InGaAs/InAlAs epitaxial layers grown over InP patterned substrates
 
 
Title: TEM analysis of InGaAs/InAlAs epitaxial layers grown over InP patterned substrates
Author: Peiro, F.
Cornet, A.
Morante, J.R.
Zekentes, K.
Georgakilas, A.
Appeared in: Materials letters
Paging: Volume 21 (1994) nr. 5-6 pages 5 p.
Year: 1994
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 12 of 15 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands