|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 121 of 156 found articles
| Title: |
Quantifying eigenstrain distributions induced by focused ion beam damage in silicon |
| Author: |
Korsunsky, Alexander M. Guénolé, Julien Salvati, Enrico Sui, Tan Mousavi, Mahmoud Prakash, Arun Bitzek, Erik |
| Appeared in: |
Materials letters |
| Paging: | Volume 185 (2016) nr. C pages 3 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 121 of 156 found articles
| << previous | next >> |