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Journal description
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Details for article 8 of 71 found articles
| Title: |
Atomic-scale characterization of Si(110)/6H-SiC(0001) heterostructure by HRTEM |
| Author: |
Li, L.B. Chen, Z.M. Zang, Y. Feng, S. |
| Appeared in: |
Materials letters |
| Paging: | Volume 163 (2016) nr. C pages 4 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 71 found articles
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