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Atomic layer deposited Al2O3 on high quality p-type epitaxial-GaAs/Ge for advanced III–V/Ge based device application |
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Titel: |
Atomic layer deposited Al2O3 on high quality p-type epitaxial-GaAs/Ge for advanced III–V/Ge based device application |
Auteur: |
Kumar Dalapati, Goutam Chakraborty, Sandipan Mahata, Chandreswar Amin Bhuiyan, Maruf Dong, Jianrong Iskander, Aneesa Masudy-panah, Saied Dinda, Sanghamitra Bin Yang, Ren Lee, Taeyoon Chi, Dongzhi Kean Chia, Ching |
Verschenen in: |
Materials letters |
Paginering: |
Jaargang 156 (2015) nr. C pagina's 4 p. |
Jaar: |
2015 |
Inhoud: |
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Uitgever: |
Elsevier B.V. |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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