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Journal description
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Details for article 3 of 18 found articles
| Title: |
Electron energy-loss spectroscopy as an analytical tool in the study of TiSi2/Si interfaces |
| Author: |
Shulga, Yu.M. Glebovsky, V.G. Dulinets, Yu.Ch. Rubtsov, V.I. Borodko, Yu.G. |
| Appeared in: |
Materials letters |
| Paging: | Volume 15 (1993) nr. 5-6 pages 6 p. |
| Year: |
1993 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 18 found articles
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