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Journal description
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Details for article 10 of 16 found articles
| Title: |
Fatigue of polycrystalline silicon for microelectromechanical system applications: crack growth and stability under resonant loading conditions |
| Author: |
Muhlstein, C.L. Howe, R.T. Ritchie, R.O. |
| Appeared in: |
Mechanics of materials |
| Paging: | Volume 36 (2004) nr. 1-2 pages 21 p. |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 16 found articles
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