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Journal description
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Details for article 7 of 20 found articles
| Title: |
Concurrent delamination propagation and deformation localization in semiconductor devices |
| Author: |
Lavoie, Shawn R. Nian, Guodong Li, Chen-Wei Lan, Jason Lin, Yu-Sheng Lin, Yi-Lun Tang, Sherwin Wu, Jyun-Lin Vlassak, Joost J. Suo, Zhigang |
| Appeared in: |
Mechanics of materials |
| Paging: | Volume 195 () nr. C pages p. |
| Year: |
2024 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 20 found articles
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