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  Unlocking inherent values of manufacturing metadata through digital characteristics (DC) alignment
 
 
Title: Unlocking inherent values of manufacturing metadata through digital characteristics (DC) alignment
Author: Liu, Heli
Yang, Xiao
Weill, Maxim
Li, Shengzhe
Wu, Vincent
Politis, Denis J.
Shi, Huifeng
Zhang, Zhichao
Wang, Liliang
Appeared in: Computers in industry
Paging: Volume 163 () nr. C pages p.
Year: 2024
Contents:
Publisher: The Authors
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 10 of 10 found articles
 
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