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Journal description
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Details for article 10 of 19 found articles
| Title: |
DMWMNet: A novel dual-branch multi-level convolutional network for high-performance mixed-type wafer map defect detection in semiconductor manufacturing |
| Author: |
Zhang, Xiangyan Jiang, Zhong Yang, Hong Mo, Yadong Zhou, Linkun Zhang, Ying Li, Jian Wei, Shimin |
| Appeared in: |
Computers in industry |
| Paging: | Volume 161 () nr. C pages p. |
| Year: |
2024 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 19 found articles
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