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Journal description
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Details for article 3 of 7 found articles
| Title: |
Development of taxonomy for classifying defect patterns on wafer bin map using Bin2Vec and clustering methods |
| Author: |
Lee, Dong-Hee Kim, Eun-Su Choi, Seung-Hyun Bae, Young-Mok Park, Jong-Bum Oh, Young-Chan Kim, Kwang-Jae |
| Appeared in: |
Computers in industry |
| Paging: | Volume 152 () nr. C pages p. |
| Year: |
2023 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 7 found articles
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