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Journal description
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Details for article 6 of 32 found articles
| Title: |
An improved stacking ensemble learning model for predicting the effect of lattice structure defects on yield stress |
| Author: |
Zhang, Zhiwei Zhang, Yuyan Wen, Yintang Ren, Yaxue Liang, Xi Cheng, Jiaxing Kang, Mengqi |
| Appeared in: |
Computers in industry |
| Paging: | Volume 151 () nr. C pages p. |
| Year: |
2023 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 32 found articles
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