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Journal description
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Details for article 29 of 40 found articles
| Title: |
Multiple degradation mode analysis via gated recurrent unit mode recognizer and life predictors for complex equipment |
| Author: |
Luo, Qinyuan Chang, Yuanhong Chen, Jinglong Jing, Hongjie Lv, Haixin Pan, Tongyang |
| Appeared in: |
Computers in industry |
| Paging: | Volume 123 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 29 of 40 found articles
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