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Journal description
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Details for article 17 of 19 found articles
| Title: |
Stacked convolutional sparse denoising auto-encoder for identification of defect patterns in semiconductor wafer map |
| Author: |
Yu, Jianbo Zheng, Xiaoyun Liu, Jiatong |
| Appeared in: |
Computers in industry |
| Paging: | Volume 109 (2019) nr. C pages 121-133 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 19 found articles
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