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Journal description
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Details for article 3 of 36 found articles
| Title: |
A patch analysis method to detect seam carved images |
| Author: |
Wei, Jyh-Da Lin, Yu-Ju Wu, Yi-Jing |
| Appeared in: |
Pattern recognition letters |
| Paging: | Volume 36 (2014) nr. C pages 7 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 36 found articles
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