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Journal description
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Details for article 18 of 18 found articles
| Title: |
XRD2 micro-diffraction analysis of the interface between Y-TZP and veneering porcelain: Role of application methods |
| Author: |
Tholey, Michael J. Berthold, Christoph Swain, Michael V. Thiel, Norbert |
| Appeared in: |
Dental materials |
| Paging: | Volume 26 (2010) nr. 6 pages 8 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Academy of Dental Materials |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 18 found articles
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