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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 7 of 9 found articles
| Title: |
Efficient march test for 3-coupling faults in random access memories |
| Author: |
Caşcaval, P. Bennett, S. |
| Appeared in: |
Microprocessors and microsystems |
| Paging: | Volume 24 (2001) nr. 10 pages 9 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 9 found articles
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