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                                       Details for article 4 of 9 found articles
 
 
  Dry etch damage and recovery of gallium indium zinc oxide thin-film transistors with etch-back structures
 
 
Title: Dry etch damage and recovery of gallium indium zinc oxide thin-film transistors with etch-back structures
Author: Park, Jae Chul
Lee, Ho-Nyeon
Appeared in: Displays
Paging: Volume 33 (2012) nr. 3 pages 3 p.
Year: 2012
Contents:
Publisher: Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 4 of 9 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands