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Details for article 21 of 40 found articles
| Title: |
Quality enhancement of interferometric fringe pattern based on deep-learning-based denoising of combined noise |
| Author: |
Bae, Juncheol Kim, Yangjin Ito, Yusuke Sugita, Naohiko Mitsuishi, Mamoru |
| Appeared in: |
Precision engineering |
| Paging: | Volume 95 () nr. C pages 75-88 |
| Year: |
2025 |
| Contents: | |
| Publisher: |
Elsevier Inc. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 21 of 40 found articles
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