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                                       Details for article 32 of 32 found articles
 
 
  Viscoelastic behavior of polishing pad: Effects on edge roll-off during silicon wafer polishing
 
 
Title: Viscoelastic behavior of polishing pad: Effects on edge roll-off during silicon wafer polishing
Author: Satake, Urara
Harada, Sena
Enomoto, Toshiyuki
Appeared in: Precision engineering
Paging: Volume 62 () nr. C pages 30-39
Year: 2020
Contents:
Publisher: Elsevier Inc.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 32 of 32 found articles
 
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