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Journal description
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Details for article 33 of 56 found articles
| Title: |
Extension of the range of profile surface roughness measurements using metrological atomic force microscope |
| Author: |
Misumi, Ichiko Sugawara, Kentaro Kizu, Ryosuke Hirai, Akiko Gonda, Satoshi |
| Appeared in: |
Precision engineering |
| Paging: | Volume 56 (2019) nr. C pages 321-329 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Inc. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 33 of 56 found articles
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