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Journal description
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Details for article 15 of 27 found articles
| Title: |
Experimental and theoretical investigation of needle contact behavior of wafer level probing |
| Author: |
Chang, Hao-Yuan Pan, Wen-Fung Lin, Shueei-Muh |
| Appeared in: |
Precision engineering |
| Paging: | Volume 35 (2011) nr. 2 pages 8 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier Inc. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 27 found articles
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