An accuracy assessment of the surface reflectance product from the EMIT imaging spectrometer
Titel:
An accuracy assessment of the surface reflectance product from the EMIT imaging spectrometer
Auteur:
Coleman, Red Willow Thompson, David R. Brodrick, Philip G. Dor, Eyal Ben Cox, Evan Pérez García-Pando, Carlos Hoefen, Todd Kokaly, Raymond F. Meyer, John M. Ochoa, Francisco Okin, Gregory S. Pearlshtien, Daniela Heller Swayze, Gregg Green, Robert O.