|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 10 of 40 found articles
| Title: |
Electronic characterization of defect sites on Si(001)-(2 × 1) by STM |
| Author: |
Ukraintsev, V.A. Dohnálek, Z. Yates Jr., J.T. |
| Appeared in: |
Surface science |
| Paging: | Volume 388 (1997) nr. 1-3 pages 9 p. |
| Year: |
1997 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 40 found articles
| << previous | next >> |