|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 5 of 30 found articles
| Title: |
Analysis of reflectivity spectra of silicon implanted with 70 keV B, Si, and Ag ions |
| Author: |
Czarnecka-Such, E. Kisiel, A. |
| Appeared in: |
Surface science |
| Paging: | Volume 193 (1988) nr. 1-2 pages 14 p. |
| Year: |
1988 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 30 found articles
| << previous | next >> |