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Journal description
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Details for article 2 of 47 found articles
| Title: |
A kinetic analysis of residual stress evolution in polycrystalline thin films |
| Author: |
Chason, Eric |
| Appeared in: |
Thin solid films |
| Paging: | Volume 526 (2012) nr. C pages 14 p. |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 47 found articles
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