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Journal description
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Details for article 51 of 65 found articles
| Title: |
Structural characterization of sputtered indium oxide films deposited at room temperature |
| Author: |
Hotovy, I. Pezoldt, J. Kadlecikova, M. Kups, T. Spiess, L. Breza, J. Sakalauskas, E. Goldhahn, R. Rehacek, V. |
| Appeared in: |
Thin solid films |
| Paging: | Volume 518 (2010) nr. 16 pages 4 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 51 of 65 found articles
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