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                                       Details for article 7 of 11 found articles
 
 
  Microstructure and growth kinetics of CrSi2 on Si{100} studied using cross-sectional transmission electron microscopy
 
 
Title: Microstructure and growth kinetics of CrSi2 on Si{100} studied using cross-sectional transmission electron microscopy
Author: Natan, Menachem
Duncan, S.W.
Appeared in: Thin solid films
Paging: Volume 123 (1985) nr. 1 pages 17 p.
Year: 1985
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 7 of 11 found articles
 
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