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Automatic quantification and classification of microplastics in scanning electron micrographs via deep learning |
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Titel: |
Automatic quantification and classification of microplastics in scanning electron micrographs via deep learning |
Auteur: |
Shi, Bin Patel, Medhavi Yu, Dian Yan, Jihui Li, Zhengyu Petriw, David Pruyn, Thomas Smyth, Kelsey Passeport, Elodie Miller, R.J. Dwayne Howe, Jane Y. |
Verschenen in: |
The science of the total environment |
Paginering: |
Jaargang 825 () nr. C pagina's p. |
Jaar: |
2022 |
Inhoud: |
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Uitgever: |
The Authors |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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