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                                       Details for article 18 of 31 found articles
 
 
  Interferometric phase microscopy using slightly-off-axis reflective point diffraction interferometer
 
 
Title: Interferometric phase microscopy using slightly-off-axis reflective point diffraction interferometer
Author: Bai, Hongyi
Zhong, Zhi
Shan, Mingguang
Liu, Lei
Guo, Lili
Zhang, Yabin
Appeared in: Optics and lasers in engineering
Paging: Volume 90 (2017) nr. C pages 6 p.
Year: 2017
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 18 of 31 found articles
 
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