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Journal description
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Details for article 10 of 17 found articles
| Title: |
Micro-Raman spectroscopy stress measurement method for porous silicon film |
| Author: |
Li, Qiu Qiu, Wei Tan, Haoyun Guo, Jiangang Kang, Yilan |
| Appeared in: |
Optics and lasers in engineering |
| Paging: | Volume 48 (2010) nr. 11 pages 7 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 17 found articles
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