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                                       Details for article 14 of 18 found articles
 
 
  Micro-Raman spectroscopy characterization of polycrystalline silicon films fabricated by excimer laser crystallization
 
 
Title: Micro-Raman spectroscopy characterization of polycrystalline silicon films fabricated by excimer laser crystallization
Author: Kuo, Chil-Chyuan
Appeared in: Optics and lasers in engineering
Paging: Volume 47 (2009) nr. 5 pages 5 p.
Year: 2009
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 14 of 18 found articles
 
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