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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 12 of 13 found articles
| Title: |
Thin-film thickness profile measurement using wavelet transform in wavelength-scanning interferometry |
| Author: |
Hwang, Young-Min Yoon, Sung-Won Kim, Jung-Hwan Kim, Souk Pahk, Heui-Jae |
| Appeared in: |
Optics and lasers in engineering |
| Paging: | Volume 46 (2008) nr. 2 pages 6 p. |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 13 found articles
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