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                                       Details for article 25 of 35 found articles
 
 
  New data-processing technique for measurement of metallic foil thickness with differential white-light interferometry
 
 
Title: New data-processing technique for measurement of metallic foil thickness with differential white-light interferometry
Author: Du, Yanli
Yan, Huimin
Nie, Yongjun
Zhang, Xiuda
Zheng, Minmin
Appeared in: Optics and lasers in engineering
Paging: Volume 45 (2007) nr. 1 pages 5 p.
Year: 2007
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 25 of 35 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands