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Journal description
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Details for article 25 of 26 found articles
| Title: |
Spectral interference ellipsometry for film thickness measurement on transparent substrate |
| Author: |
Zhang, Jinxu Shi, Liheng Zhang, Ruixue Chen, Jiayang Wu, Guanhao |
| Appeared in: |
Optics and lasers in engineering |
| Paging: | Volume 171 () nr. C pages p. |
| Year: |
2023 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 25 of 26 found articles
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