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                                       Details for article 17 of 35 found articles
 
 
  Mechanical properties measurement of materials and devices at micro- and nano-scale by optical methods: A review
 
 
Title: Mechanical properties measurement of materials and devices at micro- and nano-scale by optical methods: A review
Author: Liu, Mengxiong
Li, Xide
Appeared in: Optics and lasers in engineering
Paging: Volume 150 () nr. C pages p.
Year: 2022
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 17 of 35 found articles
 
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