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Journal description
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Details for article 28 of 64 found articles
| Title: |
High-accuracy simultaneous measurement of surface profile and film thickness using line-field white-light dispersive interferometer |
| Author: |
Guo, Tong Zhao, Guanhua Tang, Dawei weng, Qianwen Sun, Changbin Gao, Feng Jiang, Xiangqian |
| Appeared in: |
Optics and lasers in engineering |
| Paging: | Volume 137 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
The Authors |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 28 of 64 found articles
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