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Journal description
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Details for article 42 of 55 found articles
| Title: |
Quality assessment of the optical thin films using line field spectral domain optical coherence tomography |
| Author: |
Shirazi, Muhammad Faizan Wijesinghe, Ruchire Eranga Ravichandran, Naresh Kumar Kim, Pilun Jeon, Mansik Kim, Jeehyun |
| Appeared in: |
Optics and lasers in engineering |
| Paging: | Volume 110 () nr. C pages 47-53 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 42 of 55 found articles
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