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Journal description
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Details for article 15 of 21 found articles
| Title: |
Pixel-based absolute surface metrology by three flat test with shifted and rotated maps |
| Author: |
Zhai, Dede Chen, Shanyong Xue, Shuai Yin, Ziqiang |
| Appeared in: |
Optics and lasers in engineering |
| Paging: | Volume 102 (2018) nr. C pages 92-99 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 21 found articles
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