|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 28 of 40 found articles
| Title: |
Improving reliability in NoCs by reconstructing location distribution of management cores |
| Author: |
Fu, Fangfa Lou, Binglei Chen, Yukun Wang, Jinxiang |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 90 () nr. C pages 133-140 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 28 of 40 found articles
| << previous | next >> |