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Journal description
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Details for article 16 of 17 found articles
| Title: |
Impact of work-function variation on analog figures-of-merits for high-k/metal-gate junctionless FinFET and gate-all-around nanowire MOSFET |
| Author: |
Lü, Wei-Feng Dai, Liang |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 84 () nr. C pages 54-58 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 16 of 17 found articles
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