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Journal description
All volumes of the corresponding journal
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Details for article 14 of 15 found articles
| Title: |
Statically triggered 3×VDD-Tolerant ESD detection circuit in a 90-nm low-voltage CMOS process |
| Author: |
Yang, Zhaonian Yang, Yuan Yu, Ningmei Liou, Juin J. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 78 () nr. C pages 88-93 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 15 found articles
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