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Journal description
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Details for article 1 of 20 found articles
| Title: |
A fault-analysis oriented re-design and cost-effectiveness evaluation methodology for error tolerant applications |
| Author: |
Hsieh, Tong-Yu Li, Kuan-Hsien Chung, Chen-Chia |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 66 () nr. C pages 48-57 |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 20 found articles
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