|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 16 of 20 found articles
| Title: |
Oxide thickness and S/D junction depth based variation aware OTA design using underlap FinFET |
| Author: |
Nandi, Ashutosh Saxena, Ashok K. Dasgupta, S. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 55 () nr. C pages 19-25 |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 16 of 20 found articles
| << previous | next >> |