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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 2 of 12 found articles
| Title: |
A 20nm robust single-ended boost-less 7T FinFET sub-threshold SRAM cell under process–voltage–temperature variations |
| Author: |
Kushwah, C.B. Vishvakarma, S.K. Dwivedi, D. |
| Appeared in: |
Microelectronics journal |
| Paging: | Volume 51 () nr. C pages 75-88 |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 12 found articles
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